| Title |
Correlation between Building Facade Elements and Defects through "Pixelization Method" |
| Authors |
Kim, Wooram ; Jeon, Yongdeok ; Shin, Jeongran ; Jeong, Kichang ; Lee, Jaeseob |
| DOI |
http://dx.doi.org/10.6106/KJCEM.2016.17.4.040 |
| Keywords |
Pixelization Method ; Facade Element ; Defect ; Database |
| Abstract |
The construction industry has been made diversified on the design process depending on qualitative growth of customers' demands. But this approach has lead to problems such as falling of building values due to lack of awareness of defects caused by long term utilization. So, the relationship on the characteristics of buildings and defects should be clearly analyzed to prevent falling of building values. This study, therefore, proposed a technique to quantify the relationship between building facade elements and defects. The technique was developed by applying pixel concept to the outside of the buildings. It has a feature to determine the clear relationship by presenting quantitative data that have been recognized qualitatively. The proposed technique is referred to "Pixelization Method". It separates building facade into unit compartment and makes database by assigning a code depending on the characteristics. Through the method, this study is expected to create a foundation for the quantitative analysis of relationship between building facade elements and defects as a basis on active responding to the deefcts. |